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2000
Telecommunication Infrastructure Supporting Business Solutions in the 21st Century / Semiconductor Manufacturing and Inspection Systems : Volume 49 Number 4 December 2000
Telecommunication Infrastructure Supporting Business Solutions in the 21st Century / Semiconductor Manufacturing and Inspection Systems
Volume 49 Number 4 December 2000
Telecommunication Infrastructure Supporting Business Solutions in the 21st Century
Semiconductor Manufacturing and Inspection Systems
Telecommunication Infrastructure Supporting Business Solutions in the 21st Century
Preface
Special Issue on Telecommunication Infrastructure Supporting Business Solutions in the 21st Century
Masaaki Hayashi
Featured Articles
Platform Architecture for Networked Business
Akihiko Takase, D. Sc. / Susumu Kikuchi
Carrier Network Infrastructure for Integrated Optical and IP Network
Noboru Endo, Ph. D. / Morihito Miyagi / Tatsuo Kanetake, Ph. D. / Akihiko Takase, D. Sc.
Terabit Node for Next-generation IP Networks
Itaru Mimura / Takeki Yazaki / Norihiko Moriwaki
Gigabit Routers for Advanced IP Networks
Naoya Ikeda / Kenji Hayashi / Yoshifumi Atarashi
High-speed Optical Transmission System for Backbone Networks
Kazutaka Sakai / Kagehiro Yamamoto / Kiichirou Taima / Ichirou Ishikawa
Operations Support System Solutions for IP Networks
Masataka Ohta / Fumitoshi Saito / Ken'ya Nishiki / Ken'ichi Yoshida, D. Eng.
IP Network Access System
Shiro Tanabe, D. Eng. / Susumu Matsui / Kazuho Miki / Takaaki Higashi
Next-generation Mobile-access IP Network
Koji Hirayama / Haruo Shibata / Hidenori Inouchi / Tetsuhiko Hirata
Large-scale High-quality Communication Service Soluiton Using Active Network Technology
Takashi Nishikado / Minoru Koizumi / Hideo Oochi
VoIP Solutions for Enterprise Communication Systems
Kazuhisa Tanaka / Shigeaki Kinoshita / Hideyuki Toki / Kouichi Kaneko
Corporate Network System Using VoIP Technology
Jun'ichi Kojima / Masami Ôshita / Kôichi Kaneko / Takashi Maruyama
IP Gateway System for Telecommunication Carriers
Naoki Ema / Seishi Fujishiro / Kouta Funaki
page top
Semiconductor Manufacturing and Inspection Systems
Preface
Semiconductor Manufacturing and Inspection Systems
Toshihiro Sanematsu
Featured Articles
Semiconductor Manufacturing and Inspection Technologies for the 0.1 µm Process Generation
Takafumi Tokunaga / Katsutaka Kimura / Jun Nakazato / Masaki Nagao, D. Eng.
Electron Beam Mask Writing System for High-precision Reticles
—The HL-900M Series—
Genya Matsuoka / Kazui Mizuno / Tetsuji Nakahara / Hidetoshi Satô
A UHF-ECR Plasma Etcher for Insulation Films
Hironobu Kawahara / Takafumi Tokunaga / Masayuki Kojima / Ken'etsu Yokogawa
Semiconductor Inspection System for Next-generation
Yasutsugu Usami / Seiji Isogai / Isao Kawata
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